Chanana, Ravi Kumar. “Metal-Insulator-Semiconductor Characterization by Fowler-Nordheim Carrier Tunnelling Currents Through MOS Devices”. Transactions on Engineering and Computing Sciences 11, no. 5 (September 10, 2023): 45–50. Accessed November 22, 2024. https://journals.scholarpublishing.org/index.php/TMLAI/article/view/15489.