HARINATH, Depavath; BABU, K. Ramesh; SATYANARAYANA, P.; MURTHY, M.V. Ramana. Defect Detection in Fabric using Wavelet Transform and Genetic Algorithm. Transactions on Engineering and Computing Sciences, [S. l.], v. 3, n. 6, p. 10, 2016. DOI: 10.14738/tmlai.36.1551. Disponível em: https://journals.scholarpublishing.org/index.php/TMLAI/article/view/1551. Acesso em: 26 mar. 2026.